SAHA INSTITUTE OF NUCLEAR PHYSICS
Department of Atomic Energy, Govt. of India
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Prof. Satyajit Hazra

Senior Professor
Room No : Isotope Bldg
Ext. : 4219
Email id : satyajit.hazra[AT]saha.ac.in
Division :
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Facility: VT-UHV-SPM
   
Description Variable temperature ultra high vacuum scanning probe microscope (VT-UHV-SPM) works both for top surface imaging and local spectroscopy in wide temperature range and in UHV. Features can also be grown or modified in the analysis chamber for the above studies.

Users and Publications
 
Model VT Beam Deflection AFM
   
Make Omicron Nanotechnology, Germany
   
Installation place & date Room # 126 & May, 2004
   
Chambers AFM chamber and Analysis chamber
   
System base pressure UHV (10-10 mbar)
Turbo backed by rotary pump
Ion pump with TSP
   
Multi-mode operation STM: Tunneling current
AFM Contact: Cantilever distortion
AFM Non-contact: Resonance frequency shift
   
Temperature range 25 - 1500 K (in measurement chamber)
Room - 25 K using cooling sample plate & LHe
Room - 1500 K using direct heating sample plate
Room - 750 K using resistive heating sample plate
300 – 1500 K (in manipulator)
   
Scanner Single tube scanner
Scan range: 10 µm x 10 µm (max)
Z-range: 1.5 µm; Resolution better than 0.01 nm
   
Sample size
3 mm x 9 mm x 2 mm (for VT Compatibility)
12 mm x 12 mm x 2 mm (for others)
   
STM tip Wire made of Platinum-Iridium or Tungsten
 
 
AFM cantilevers Silicon or Silicon nitride (Si3N4)
Typical Contact cantilever
Material:                    Silicon
Dimensions:               450 µm x 50 µm
Force constant:          0.3 N/m
Resonance freq:         ~13 kHz
Typical Non-Contact cantilever
Material:                    Silicon
Dimensions:               125 µm x 30 µm
Force constant:          42 N/m
Resonance freq:         ~320 kHz
   
Accessories Cold cathode ion sputter source (ISE5)
Evaporator (EFM 3)
LEED-AES system (SPECTRA LEED)

 

Last Updated on Friday, 11 April 2014 19:21
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