Prof. Satyajit Hazra

Facility: VT-UHV-SPM     Description Variable temperature ultra high vacuum scanning probe microscope (VT-UHV-SPM) works both for top surface imaging and local spectroscopy in wide temperature range and in UHV. Features can also be grown or modified in the analysis chamber for the above studies. Users and Publications   Model VT Beam Deflection AFM     Make Omicron Nanotechnology, Germany     Installation place & date Room # 126 & May, 2004     Chambers AFM chamber and Analysis chamber     System base pressure UHV (10-10 mbar) Turbo backed by rotary pump Ion pump with TSP     Multi-mode operation STM: Tunneling current AFM Contact: Cantilever distortion AFM Non-contact: Resonance frequency shift     Temperature range 25 - 1500 K (in measurement chamber) Room - 25 K using cooling sample plate & LHe Room - 1500 K using direct heating sample plate Room - 750 K using resistive heating sample plate 300 – 1500 K (in manipulator)     Scanner Single tube scanner Scan range: 10 µm x 10 µm (max) Z-range: 1.5 µm; Resolution better than 0.01 nm     Sample size 3 mm x 9 mm x 2 mm (for VT Compatibility) 12 mm x 12 mm x 2 mm (for others)     STM tip Wire made of Platinum-Iridium or Tungsten     AFM cantilevers Silicon or Silicon nitride (Si3N4) Typical Contact cantilever Material:                    Silicon Dimensions:               450 µm x 50 µm Force constant:          0.3 N/m Resonance freq:         ~13 kHz Typical Non-Contact cantilever Material:                    Silicon Dimensions:               125 µm x 30 µm Force constant:          42 N/m Resonance freq:         ~320 kHz     Accessories Cold cathode ion sputter source (ISE5) Evaporator (EFM 3) LEED-AES system (SPECTRA LEED)