R. Mondal Saha,^d K. Banerjee,^a,b A. Chakraborty,^c N. Gayathri,^a,b S. S. Nayak,^a,b S. Jana^d G. R. Umapathy,^e R. Shil,^c A. Basak,^c S. Bhattacharyya,^a,b S. Hazra^d and S. A. Khan^e
aVariable Energy Cyclotron Centre, 1/AF Bidhannagar, Kolkata 700064, India
^bHomi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400094, India
^cDepartment of Physics, Visva-Bharati, Santiniketan 731235, India
^dSaha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata 700064, India
^eInter University Accelerator Centre New Delhi, India

Natural and isotopically enriched selenium targets with a typical thickness of 6.8 mg/cm² were prepared using only 20 mg of powder, which was deposited on a Mylar backing through sedimentation process. The surface morphology of these targets was examined using scanning electron microscopy, while elemental analysis was conducted through X-ray photoelectron spectroscopy, energy-dispersive X-ray spectroscopy and X-ray diffraction technique. These analyses confirmed that the selenium retained its crystalline structure, with no elemental impurities other than carbon and oxygen. The presence of carbon and oxygen was mainly due to the polyvinyl alcohol used during fabrication. The thickness of the targets was measured via X-ray attenuation using a Germanium-based low-energy photon spectrometer. These targets were subsequently employed in ion-beam-induced γ-ray spectroscopic measurements to investigate the nuclear level structure of ^81,82Br. Even after five days of continuous beam exposure, the condition of the targets remained unchanged. X-ray diffraction analysis of the irradiated targets showed no significant changes in microstrain and crystallite size.