| Citation of | ||||||
| # | Extraction of density profile for near perfect multilayers | M K Sanyal, S Hazra, J K Basu, A Datta | Phys Rev B | 58 | R4258 | ### |
| 40 | Nanoparticles at Liquid Interfaces | M K Bera, .. | Nanoscience Nanotech | 21 | 121 | 2021 |
| 39 | Mesoporous titania films investigated by positron annihilation based on a slow positron beam | B Xiong, .. | Chinese J Phys | 56 | 355 | 2018 |
| 38 | Cholesterol induced structural changes in saturated phospholipid model membranes revealed through X-ray scattering technique | R P Giri, .. | J Phys Chem B | 121 | 4081 | 2017 |
| 37 | Specular X-ray reflectivity study of interfacial SiO2 layer in thermally annealed NiO/Si assembly | S Mitra, .. | Appl Phys A | 117 | 1185 | 2014 |
| 36 | Improvement of X-ray reflectivity calculation on surface and interface roughness | Y Fujii | Jpn J Appl Phys | 536 | 05FH06 | 2014 |
| 35 | Substrate suppression of thermal roughness in stacked supported bilayers | C M DeCaro, .. | Phys Rev E | 84 | 041914 | 2011 |
| 34 | Sticking polydisperse hydrophobic magnetite nanoparticles to lipid membranes | M Paulus, .. | Langmuir | 26 | 15945 | 2010 |
| 33 | Small-angle x-ray scattering study of the aggregation of gold nanoparticles during formation at the toluene-water interface | M K Bera, .. | Phys Rev B | 81 | 115415 | 2010 |
| 32 | X-ray diagnostics of semiconductor heterostructures: Some achievements and perspectives for development | R M Imamov, I A Subbotin | J Surf Investig X-Ray Synchro | 4 | 104 | 2010 |
| 31 | Adsorption at liquid interfaces: A comparison of multiple experimental techniques | B M Law, .. | Eur Phys J Special Topics | 167 | 127 | 2009 |
| 30 | In situ observation of maghemite nanoparticle adsorption at the water/ gas interface | M Paulus, .. | Eur Phys J Special Topics | 167 | 133 | 2009 |
| 29 | Solution of the inverse problem for reconstructing the real structure of materials from the data of different X-ray methods | A. G. Sutyrin, R. M. Imamov | Crystallogr Rep | 54 | 174 | 2009 |
| 28 | Stochastic fitting of specular X-ray reflectivity data using StochFit | S M Danauskas, .. | J Appl Crystallogr | 41 | 1187 | 2008 |
| 27 | In situ observation of γ-Fe2O3 nanoparticle adsorption under different monolayers at the air/water interface | P Degen, .. | Langmuir | 24 | 12958 | 2008 |
| 26 | Steady-state electrical transport through block copolymer nanostructures deposited on smooth and rough electrodes | R Křenek, M Stamm, V Cimrova | J Appl Phys | 103 | 044306 | 2008 |
| 25 | Formation and ordering of gold nanoparticles at the toluene-water interface | M K Sanyal, .. | J Phys Chem C | 112 | 1739 | 2008 |
| 24 | A comparison of modern data analysis methods for X-ray and neutron specular reflectivity data | A van der Lee, .. | J Appl Crystallogr | 40 | 820 | 2007 |
| 23 | X-ray and ellipsometric study of strong critical adsorption | M D Brown, .. | Phys Rev E | 75 | 061606 | 2007 |
| 22 | Interfacial role in room-temperature diffusion of Au into Si substrates | J K Bal, S Hazra | Phys Rev B | 75 | 205411 | 2007 |
| 21 | Structural and nonlinear-optical studies of ultra thin Si/SiO2 multiple quantum wells | A A Lomov, .. | Proc SPIE | 626016 | 2006 | |
| 20 | Subnanometer-scale size effects in electronic spectra of Si/SiO2 multiple quantum wells: Interferometric second-harmonic generation spectroscopy | V G Avramenko, .. | Phys Rev B | 73 | 155321 | 2006 |
| 19 | X-ray specular reflectivity study of a critical binary fluid mixture | L W Marschand, .. | Phys Rev E | 72 | 011509 | 2005 |
| 18 | Crystallisation kinetics and density profiles in ultra-thin hafnia films: Crystallisation and structure of HfO2 films | A van der Lee, .. | Eur Phys J B | 39 | 273 | 2004 |
| 17 | Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films | M Bhattacharya, .. | J Appl Phys | 94 | 2882 | 2003 |
| 16 | Morphology of nanostructured materials | M K Sanyal, A Datta, S Hazra | Pure Appl Chem | 74 | 1553 | 2002 |
| 15 | Critical comparison of recent analysis methods of X-ray and neutron reflectivity data | A van der Lee | J de Physique IV | 12 | 255 | 2002 |
| 14 | Reconstruction of the surface layer density profile by the X-ray reflectometry method | V A Bushuev, .. | Crystallogr Rep | 47 | 683 | 2002 |
| 13 | Ordering and growth of Langmuir-Blodgett films: X-ray scattering studies | J K Basu, M K Sanyal | Phys Rep | 363 | 1 | 2002 |
| 12 | Structural and chemical characterization of 4.0 nm thick oxynitride films | S Banerjee, .. | J Appl Phys | 91 | 540 | 2002 |
| 11 | The structure of hexane/perfluorohexane thin liquid films | W Prange, .. | J Phys-Condens Mat | 13 | 4957 | 2001 |
| 10 | Study of thin film multilayers using X-ray reflectivity and scanning probe microscopy | S Banerjee, .. | Vacuum | 60 | 371 | 2001 |
| 9 | Density profiles in thin PMMA supported films investigated by X-ray reflectometry | A van der Lee, .. | Langmuir | 17 | 7664 | 2001 |
| 8 | Grazing incidence specular reflectivity: Theory, experiment, and applications | A van der Lee | Solid State Sci | 2 | 257 | 2000 |
| 7 | Phase determination of x-ray reflection coefficients | K-M Zimmermann, .. | Phys Rev B | 62 | 10377 | 2000 |
| 6 | Interfacial diffusion in a MOCVD grown barium titanate film | A Datta, .. | Mater Res Soc Symp Proc | 591 | 37 | 2000 |
| 5 | X-ray reflectivity and diffuse scattering | A Gibaud, S Hazra | Curr Sci | 78 | 1467 | 2000 |
| 4 | Surface physics at Saha Institute | S Banerjee, .. | Curr Sci | 78 | 1507 | 2000 |
| 3 | Role of interfacial correlation in melting of Langmuir-Blodgett films | J K Basu, .. | Physica B | 283 | 6 | 2000 |
| 2 | Interfacial diffusion in a double quantum well structure | S Sarkar, .. | Surf Interface Anal | 29 | 659 | 2000 |
| 1 | Study of interdiffusion in thin Fe film deposited on Si(111) by x-ray reflectivity and secondary ion mass spectrometry | S Banerjee, .. | J Appl Phys | 85 | 7135 | 1999 |